GB/T 17626.4-2008: Translated English PDF of Chinese Standard GB/T17626.4-2008

GB/T 17626.4-2008: Translated English PDF of Chinese Standard GB/T17626.4-2008

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This Part of GB/T 17626 relates to the immunity of the electrical and electronic equipment to repetitive electronic fast transients. It gives immunity requirements and test procedures related to electrical fast transients/bursts. It additionally defines ranges of test levels and establishes test procedures. The objective of this Standard is to establish a common and reproducible basis for evaluating the performance of electrical and electronic equipment when subjected to repetitive fast transients (bursts) on supply, signal and control ports. The test method documented in this Part of IEC 61000-4 describes a consistent method to assess the immunity of an equipment or system against a defined phenomenon.Electromagnetic compatibility - Testing and measurement techniques - Electrical fast transient/burst immunity test ... For testing I/O, control, signal and data EUT ports, use half the test voltage values applied on power supply. Based on commonanbsp;...


Title:GB/T 17626.4-2008: Translated English PDF of Chinese Standard GB/T17626.4-2008
Author: Wayne Zheng
Publisher:www.ChineseStandard.net - 2014-05-06
ISBN-13:

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